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Table T7. Analytical conditions for ICP-AES analyses.

Element Wavelength
(nm)
Integration
time per
calculation
point
(s)
Photomultiplier
voltage
(V)
Photomultiplier
gain
Increment
between
points
(nm)
Number of
calculation
points
Limit of
detection
(ppm)
Al 396.152 0.5 720 1 0.002 7 0.109
Ba 455.403 0.5 730 10 0.002 7 10
Ca 393.366 0.5 350 1 0.002 7 0.084
Co 228.616 0.5 990 100 0.002 7 39
Cr 267.716 0.5 860 100 0.002 7 22
Cu 324.754 0.5 690 10 0.002 7 112
Fe 259.940 0.5 560 10 0.002 7 0.328
K 766.490 0.5 990 100 0.002 7 0.014
Mg 285.213 0.5 600 10 0.002 7 0.220
Mn 257.610 0.5 580 100 0.002 7 0.016
Na 589.592 0.5 610 10 0.002 7 0.086
Ni 231.604 0.5 990 100 0.002 7 55
P 178.229 0.5 990 100 0.002 7 0.143
Si 251.611 0.5 570 10 0.002 7 0.522
Sr 407.771 0.5 560 10 0.002 7 2
V 292.402 0.5 960 100 0.002 7 3
Y 371.029 0.5 620 100 0.002 7 2
Zr 343.823 0.5 640 100 0.002 7 6
Ti 334.941 0.5 570 10 0.002 7 0.021
Sc 361.384 0.5 660 100 0.002 7 1

Notes: ICP-AES = inductively coupled plasma–atomic emission spectrometry. † = Limit of detection reported as oxide weight percent. Detection limits of the instrument represent three times the instrumental blank (See “Analysis” in “ICP-AES analyses of major and trace elements”).

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