Table T3. Quantification of sample disturbance for CRSC test specimens. Ratings criteria are from Lunne et al. (1997).

Specimen
Hole, core, section,
interval (cm)
Depth
(m CSF)
OCR
SED
ei
en
Δe/ei
Rating
  315-
MU-12 C0002B-10R-3, 8 553.80 1.69 0.75 0.49 0.35 Very poor
MU-13 C0002B-20R-3, 54 650.37 1.69 0.66 0.51 0.22 Very poor
MU-14 C0002B-31R-1, 126 752.26 2.11 0.63 0.54 0.13 Poor
MU-15 C0002B-40R-3, 75 836.58 1.87 0.74 0.60 0.18 Very poor
MU-16 C0002B-47R-1, 38 900.88 1.78 0.68 0.61 0.11 Poor
MU-17 C0002B-48R-6, 65 916.31 1.92 0.76 0.69 0.09 Poor
MU-18 C0002B-49R-1, 113 920.63 2.10 0.71 0.58 0.19 Very poor
PSU-90 C0002B-17R-4, 8 622.99 NA 1.16 0.74 0.36 Very poor
PSU-96 C0002B-28R-2, 8 724.24 2.38 0.61 0.42 0.31 Very poor
PSU-102 C0002B-28R-2, 8 724.24 2.60 0.53 0.40 0.23 Very poor
PSU-105 C0002B-41R-4, 8 846.83 2.35 0.80 0.64 0.20 Very poor
  316-
MU-19 C0006E-5H-1, 128 35.56 8.58 0.89 0.57 0.37 Very poor
MU-20 C0006E-16X-1, 113 89.96 4.92 0.70 0.31 0.56 Very poor
MU-21 C0006E-22X-6, 5 150.04 2.71 0.82 0.44 0.47 Very poor
MU-22 C0006E-26X-1, 126 183.50 3.34 0.87 0.52 0.40 Very poor
MU-23 C0006E-34X-3, 59 261.64 2.12 0.68 0.38 0.44 Very poor
MU-24 C0007C-3H-3, 104 32.64 2.17 0.88 0.74 0.16 Very poor
MU-25 C0007D-25R-2, 66 400.59 2.71 0.96 0.81 0.15 Very poor

en = value at intersection point of Pc using SED method. NA = not applicable.