Table T1. Samples tested and experiment parameters.
| Experiment | Hole, core, section | Depth (mbsf) |
ho (mm) |
γmax | Stratigraphic location | State |
|---|---|---|---|---|---|---|
| 316- | ||||||
| P2118 | C0004C-15X-2 | 119.28 | 2.42 | 6.1 | Accretionary prism | Wafer |
| P2627 | C0004D-22R-1 | 243.10 | 1.39 | 20.5 | Accretionary prism | Powder |
| P2102 | C0004D-27R-1 | 266.16 | 1.14 | 16.0 | Fault zone | Powder |
| P2069 | C0004D-29R-2 | 275.73 | 1.07 | 14.4 | Fault zone | Powder |
| P2067 | C0004D-30R-1 | 278.75 | 0.86 | 19.9 | Fault zone | Powder |
| P2068 | C0004D-34R-1 | 297.55 | 1.06 | 15.7 | Fault zone | Powder |
| P2121 | C0004D-42R-3 | 335.42 | 1.41 | 10.8 | Underthrust slope apron | Powder |
| P2112 | C0004D-47R-2 | 357.11 | 3.88 | 3.7 | Underthrust slope apron | Wafer |
| 316- | ||||||
| P2654 | C0007C-11X-4 | 103.61 | 4.58 | 7.0 | Outer trench wedge | Remolded |
| P2777 | C0007D-9R-2 | 249.37 | 2.52 | 14.6 | Fault zone | Remolded |
| P2640 | C0007D-16R-2 | 315.42 | 3.45 | 10.0 | Marginal trench wedge | Wafer |
| P2639 | C0007D 23R-2 | 381.14 | 3.43 | 14.0 | USB facies | Wafer |
| P2655 | C0007D-24R-1 | 389.28 | 3.79 | 21.0 | USB facies | Wafer |
| P2656 | C0007D-24R-1 | 389.28 | 2.20 | 22.3 | USB facies | Powder |
| P2644 | C0007D-27R-1 | 418.42 | 3.59 | 12.4 | Fault zone | Breccia |
| P2641 | C0007D-29R-1 | 437.19 | 2.15 | 29.3 | Fault zone | Powder |
USB = upper Shikoku Basin.
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