Table T1. Sample identification and analysis checklist.
Hole | Core | Section | Interval (cm) |
Depth DSF (m) |
Thin section scan |
Core photo |
Point count |
SEM | EDS | XRD | Isotope ratio |
---|---|---|---|---|---|---|---|---|---|---|---|
317- | |||||||||||
U1351B | 12H | 1W | 115–116 | 75.7 | X | X | X | X | X | X | |
U1351B | 19X | CC | 25–27 | 141.6 | X | X | X | X | X | ||
U1351B | 22X | CC | 10–12 | 170.4 | X | X | X | X | X | X | X |
U1351B | 44X | 1W | 3–8 | 381.1 | X | X | X | X | X | X | X |
U1351B | 46X | CC | 1–5 | 400.2 | X | X | X | X | X | X | X* |
U1351B | 96X | CC | 5–8 | 831.8 | X | X | X | X | X | ||
U1351B | 98X | CC | 30–34 | 851.0 | X | X | X | X | X | ||
U1351B | 100X | 3 | 15–17 | 870.3 | X | X | X | X | X | X | |
U1351B | 102X | CC | 4–8 | 889.6 | X | X | X | X | X | X | X |
U1351B | 111X | 1 | 4–7 | 975.9 | X | X | X | X | X | X | |
U1351B | 113X | 2 | 131–135 | 995.1 | X | X | X | X | X | X | X |
U1352B | 2H | 2W | 32 | 8.2 | X | X | X | X | X | X | X |
U1352B | 42X | 5W | 5 | 341.1 | X | X | X | X | X | X | |
U1352B | 52X | 7W | 4 | 437.1 | X | X | X | X | X | X | |
U1352C | 2R | 1W | 12 | 574.7 | X | X | X | X | X | X | |
U1352C | 3R | 1W | 68 | 584.4 | X | X | X | X | X | X | |
U1352C | 9R | 1W | 0 | 689.0 | X | X | X | X | X | X | X |
U1352C | 10R | 1W | 50 | 698.7 | X | X | X | X | X | X | X |
U1352C | 14R | 1W | 100 | 737.5 | X | X | X | X | X | X | |
U1352C | 15R | 1W | 131 | 747.2 | X | X | X | X | X | X | X |
U1352C | 18R | 1W | 19 | 776.3 | X | X | X | X | X | X | |
U1352C | 21R | 2W | 38 | 805.4 | X | X | X | X | X | X | |
U1352C | 22R | 2W | 33 | 815.0 | X | X | X | X | X | X | |
U1352C | 25R | CC | 0 | 843.8 | X | X | X | X | X | X | |
U1353B | 88X | 1W | 55–58 | 509.6 | X | X | X | X | X | X | X |
U1353B | 92X | CC | 8–12 | 547.1 | X | X | X | X | X | X | X |
U1354A | 15H | CC | 0 | 76.2 | X | X | X | X | X | X | X |
U1354B | 13H | 2W | 74 | 62.5 | X | X | X | X | X | X | X |
U1354C | 17X | CC | 3 | 192.6 | X | X | X | X | X | X | X |
U1354C | 20X | CC | 20 | 221.4 | X | X | X | X | X |
* = sample was run, but no result was obtained. SEM = scanning electron microscope, EDS = X-ray spectroscopy mapping, XRD = X-ray diffraction.
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