Table T9. Analyses of potential grinding contamination and background blank.
| Element |
Grinding error, Leg 206 N = 3 |
Background blank, Exp. 301 N = 4 |
|---|---|---|
| Major element oxides (wt%): | ||
| SiO2 | 0 | BDL |
| Al2O3 | BDL | BDL |
| TiO2 | BDL | 0.01 |
| Fe2O3 | BDL | 0.14 |
| MgO | BDL | 0.20 |
| MnO | BDL | BDL |
| CaO | BDL | 0.08 |
| Na2O | BDL | 0.01 |
| K2O | 0.01 | 0.03 |
| P2O5 | BDL | 0.13 |
| Trace elements (ppm): | ||
| Cr | 4.3 | BDL |
| Ni | 3.9 | 44.45 |
| V | BDL | 7.61 |
| Sc | BDL | 0.08 |
| Ba | BDL | 0.23 |
| Sr | BDL | BDL |
| Y | BDL | BDL |
| Zr | BDL | 12.06 |
| Nb | BDL | BDL |
Notes: The grinding contamination test was conducted during Leg 206 (Shipboard Scientific Party, 2003); SiO2 was subtracted from the grinding error because pure SiO2 was used to determine grinding contamination. Because the same sample preparation techniques were used during Expedition 301, these data give an indication of the potential grinding contamination in our data. The background blank was determined from drift-corrected intensities. BDL = below detection limit. N = number of determinations.
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