Table T3. Measurements and specifications for wireline tools.
| Tool string | Tool† | Measurement | Sampling interval (cm) |
Approximate vertical resolution (cm) |
|---|---|---|---|---|
| Triple combination | MGT* | Gamma ray | 15 | 15 |
| HNGS | Spectral gamma ray | 15 | 51 | |
| APS | Porosity | 5 and 15 | 43 | |
| HLDT | Bulk density | 2.5 | 38 | |
| DIT-E | Resistivity | 15 | 76/150/200 | |
| TAP | Temperature | 1 per s | NA | |
| Tool acceleration | 4 per s | NA | ||
| Pressure | 1 per s | NA | ||
| Formation MicroScanner (FMS)-sonic combination | NGT | Spectral gamma ray | 15 | 46 |
| GPIT | Tool orientation | 0.25 and 15 | NA | |
| FMS | Microresistivity | 0.25 | 0.5 | |
| DSI/SDT/LSS/BHC | Acoustic velocity | 15 | 107 |
Notes: All tool and tool string names (except the TAP and MGT) are trademarks of Schlumberger. For the complete list of acronyms used in IODP and for additional information about tool physics and use consult IODP-USIO Science Services, LDEO, at iodp.ldeo.columbia.edu/TOOLS_LABS/tools.html. * = not included in each logging run. See Table T4 for explanations of acronyms used to describe tool strings and tools. NA = not applicable.
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