Table T10. Analyses of grinding contamination and background blank.
| Element | Grinding error (N = 3) |
Background blank (N = 4) |
|---|---|---|
| Major element oxide (wt%): | ||
| SiO2 | 0 | 0.1 |
| Al2O3 | BDL | 0.01 |
| TiO2 | BDL | 0.01 |
| Fe2O3 | BDL | 0.01 |
| MgO | BDL | 0.01 |
| MnO | BDL | BDL |
| CaO | BDL | 0.1 |
| Na2O | BDL | BDL |
| K2O | 0.01 | 0.01 |
| P2O5 | BDL | 0.02 |
| Trace element (ppm): | ||
| Cr | 4.3 | 19.3 |
| Ni | 3.9 | 3.7 |
| V | BDL | 1.7 |
| Sc | BDL | 0.9 |
| Ba | BDL | 22.2 |
| Sr | BDL | 5.8 |
| Y | BDL | 1.6 |
| Zr | BDL | 9.2 |
| Nb | BDL | BDL |
Notes: SiO2 was subtracted from the grinding error because pure SiO2 was used to determine grinding contamination. The background blank was determined from drift-corrected intensities and was subtracted from standard and sample analyses. BDL = below detection limit. N = number of analyses.
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