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Table T6. Quantitative conditions for XRF analyses. (See table note.)
Oxide
(wt%)
|
Line
|
Voltage
(kV)
|
Intensity
(mA)
|
Crystal
|
Detector
|
Peak angle
(°2θ)
|
Count time (s)
|
|
Peak
|
Background
|
|
Na2O
|
K-alpha
|
50
|
4.00
|
RX25
|
PC
|
47.138
|
40
|
20
|
|
MgO
|
K-alpha
|
50
|
4.00
|
RX25
|
PC
|
38.828
|
40
|
20
|
|
Al2O3
|
K-alpha
|
50
|
4.00
|
PET
|
PC
|
144.644
|
40
|
20
|
|
SiO2
|
K-alpha
|
50
|
4.00
|
PET
|
PC
|
108.992
|
40
|
10
|
|
P2O5
|
K-alpha
|
50
|
4.00
|
PET
|
PC
|
89.429
|
40
|
20
|
|
K2O
|
K-alpha
|
50
|
4.00
|
PET
|
PC
|
50.684
|
40
|
10
|
|
CaO
|
K-alpha
|
50
|
4.00
|
PET
|
PC
|
45.191
|
40
|
10
|
|
TiO2
|
K-alpha
|
50
|
4.00
|
LiF1
|
SC
|
86.143
|
20
|
|
|
MnO
|
K-alpha
|
50
|
4.00
|
LiF1
|
SC
|
62.999
|
20
|
20
|
|
Fe2O3
|
K-alpha
|
50
|
4.00
|
LiF1
|
SC
|
57.532
|
20
|
10
|
Note: PC = flow-proportioned counter, SC = scintillation counter.
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